This is an infrared glass defect detection microscope system. The system automatically measures the position and depth of defects in the infrared glass. 

The sample is scanned during the high-precision exercise phase and the entire system is automatically operated under the industrial HMI. It suits perfectly for the inspection applications in industrial fields.

• Near infrared microscopy

• Automatic identification and automatic positioning of defect point

• Defect point depth measurement

• High-precision motion positioning system

• Industrial human-machine interface